Titanium doped silicon layers with very high concentration

Titanium doped silicon layers with very high concentration

Properties of Cement Pastes Doped with Very High Amounts of Ground Granulated Blast-furnace Slag

In the current work, the properties of cement pastes doped with high amounts of ground granulated blast-furnace slag (HVS) were investigated. Portland cement (PC) was substituted with ground granulated blast-furnace slag (donated as slag) at very high amounts of 85%, 90%, 95% and 100%, by weight. PC paste without any content of slag was used as a reference. Some fresh and hardened properties su...

Arsenic-Doped High-Resistivity-Silicon Epitaxial Layers for Integrating Low-Capacitance Diodes

An arsenic doping technique for depositing up to 40-μm-thick high-resistivity layers is presented for fabricating diodes with low RC constants that can be integrated in closely-packed configurations. The doping of the as-grown epi-layers is controlled down to 5 × 1011 cm-3, a value that is solely limited by the cleanness of the epitaxial reactor chamber. To ensure such a low doping concentratio...

Silicon-Doped Titanium Dioxide Nanotubes Promoted Bone Formation on Titanium Implants

While titanium (Ti) implants have been extensively used in orthopaedic and dental applications, the intrinsic bioinertness of untreated Ti surface usually results in insufficient osseointegration irrespective of the excellent biocompatibility and mechanical properties of it. In this study, we prepared surface modified Ti substrates in which silicon (Si) was doped into the titanium dioxide (TiO₂...

Control capability of electrolytic concentration on refractive index and dielectric constant of porous Silicon layers

Porous Silicon (PS) samples have been prepared by electrochemical anodization of p-type silicon wafer by varying HF concentrations in the electrolytic solution. The structural, surface morphological, optical and surface composition analysis of the prepared samples were done by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Photoluminescence (PL) and Fourier transform infr...